LAMP Primers and Positive Control for Detection of Banana Wilt Pathogen (Foc)

We are launching synthesis services for the LAMP primers and positive control used to detect the banana wilt pathogen, as described in the “LAMP Method for Specific Detection of Banana Wilt Pathogens” manual published by Tokyo University of Agriculture and Technology.

Fusarium oxysporum f. sp. cubense (Foc), the pathogen that causes banana wilt (Panama disease), is a soil-borne filamentous fungus; its chlamydospores—which serve as survival structures—are known to persist in the soil for decades.

A simple and rapid method for detecting the causative pathogen in infected plants or contaminated soil is a crucial tool for mitigating the damage caused by banana wilt disease.

A manual for “LAMP Method for Specific Detection of Banana Wilt Pathogens” has been released as part of “The Project on Establishment of an Alert System for Fusarium oxysporum f. sp. cubense,
the Banana and Plantain Wilt Pathogen, and Mitigation Strategy of the Disease”—a project conducted by Tokyo University of Agriculture and Technology under the Science and Technology Research Partnership for Sustainable Development (SATREPS) program (jointly operated by the Japan Science and Technology Agency and the Japan International Cooperation Agency). In conjunction with this,  synthesis services have been launched for the LAMP primers and positive control used in this detection method.